规格：

     碲化镉多晶：99.999% CdTe-5N-R-40

  检测杂质：Cu, Ag, Mg, Ni, Bi,Fe, As, Al, Pb, Zn

     杂质总含量：≤10ppm

     碲化镉多晶：99.9999% CdTe

 检测杂质：Cu, In, Ag, Mg, Ni, Bi, Fe, Al, Pb

杂质总含量：≤1ppm

用途：用于光电器件及红外探测器等。

包装：涤纶薄膜包装后，双层复合膜真空封装或玻璃管真空封装。

Specification:

 Poly-crystal Cadmium Telluride:99.999% CdTe-5N-R-40

Testing impurity: Cu, Ag, Mg, Ni,Bi, Fe, As, Al, Pb, Zn

Totalimpurity content: ≤10ppm

Poly-crystalCadmium Telluride: 99.9999% CdTe

Testingimpurity: Cu, In, Ag, Mg, Ni,Bi, Fe, Al, Pb

Totalimpurity content: ≤1ppm

Application: Used for photoelectric device,infrared receiver etc.

Package: Packed with terylene film, anddouble poly-film with vacuum encapsulation. Packed with glass tube with vacuumencapsulation directly.